ISO/TR TECHNICAL REPORT 19733 First edition 2019-03 Nanotechnologies Matrix of properties and measurement techniques for graphene and related two-dimensional (2D) materials Nanotechnologies - Matrice des propriétés et des techniques de mesure pour le graphene et autres materiaux bidimensionnels (2D) Reference number ISO/TR19733:2019(E) EC os. @IS02019 IS0/TR 19733:2019(E) COPYRIGHTPROTECTEDDOCUMENT @ IS0 2019 All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be requested from either IsO at the address below or Iso's member body in the country of the requester. ISO copyright office CP 401 : Ch. de Blandonnet 8 CH-1214 Vernier, Geneva Phone: +41 22 749 01 11 Fax: +41 22 749 09 47 Email: [email protected] Website: www.iso.org Published in Switzerland ii @ IS0 2019 - All rights reserved IS0/TR 19733:2019(E) Contents Page Foreword ..V Introduction.. ..vi 1 Scope.. 2 Normative references 3 Terms and definitions, symbols and abbreviated terms ..1 3.1 Terms and definitions ..1 3.2 Symbols and abbreviated terms. 4 Matrix of properties and measurement techniques for graphene and related 2D materials ..3 5 Properties and measurands .4 5.1 Structural properties ..4 5.1.1 Crystal defect .4 5.1.2 Domain (grain) size. .5 5.1.3 Flake size .6 5.1.4 Number of layers ..6 5.1.5 Stacking angle ..6 5.1.6 Surface area ..6 5.1.7 Thickness. .6 5.2 Chemical properties. .6 5.2.1 Metal contents. 5.2.2 Non-graphene contents and residue .7 5.2.3 Oxygen content. 5.3 Mechanical properties, elastic modulus. 7 5.4 Thermal properties, thermal conductivity 5.5 Opticalproperties,opticaltransmittance 7 5.6 Electrical and electronic properties . ..7 5.6.1 Charge carrier concentration (density) .7 5.6.2 Charge carrier mobility .8 5.6.3 Sheet resistance. .8 5.6.4 Work function. ..8 6 Measurement techniques. .8 6.1 Atomic force microscopy (AFM) ..8 6.2 Brunauer, Emmett and Teller method (BET) .9 6.3 Combustion analysis 6.4 Electron probe X-ray microanalysis (EPMA) 9 6.5 Electron spin resonance (ESR). 10 6.6 Fourier transform- infrared spectroscopy (FT-IR) .10 6.7 Hall bar measurement. ..10 6.8 Inductively coupled plasma - Mass spectrometry (ICP-MS) ..11 6.9 Kelvin probe force microscopy (KPFM) .11 6.10 Low energy electron microscopy (LEEM) .. 12 6.11 Optical microscopy. .12 6.12 Ramanspectroscopy ..12 6.13 Scanning electron microscopy (SEM). ..13 6.14 Secondary-ion mass spectrometry (SIMS) ..13 6.15 Scanning tunnelling microscopy (STM) ..13 6.16 Transmission electron microscopy (TEM) ..13 6.17 Thermogravimetric analysis (TGA) ..14 6.18 Titration. ..14 6.19 Ultraviolet photoelectron microscopy (UPS) ..14 6.20 Ultraviolet, visible, near-infrared (Uv-VIS-NIR) spectroscopy ..14 6.21 X-ray diffraction (XRD). .15 @ IS0 2019 - All rights reserved ii